Scatterometry
Nanohmics offers scatterometry services for government and industry. Our system measures BRDF for almost any application.
The Air Force Research Lab published a report stating that the Nanohmics system “exceeds” the performance of the AFRL’s own system located at Wright-Patterson AFB. More information can be found at:
http://www.afsbirsttr.com/Publications/Documents/Innovation-091109-Nanohmics-AF05-002.pdf
In-house instrument for characterization of scattering from surfaces
World-class performance with unique features:
- Multiple wavelengths (532, 633, 1313 nm, +more)
- Measures scattering in transmission and/or reflection
- Detector can measure within 5 mrad (0.3°) of source
- 5 order of magnitude instantaneous dynamic range
- Theoretical support (esp. operations with 2D surface power spectrum)
The service includes:
- Wavelength Setup
- Sample Setup
- Sample Data Processing
- Sample Positioning and Alignment
- Sample Rotation
- Sample Angle of Incidence
- Source/Detector Polarization Adjustment
- Coarse Scan or Fine Scan
Bistatic, Monostatic and Ellipsometer Scans available
